Diane Pham

NYPD to Begin Testing New Scanning Device That Can Detect Concealed Weapons

by , 01/25/13
filed under: News

nypd, gun control, nypd gun control, gun tech, scan and frisk technology, police technology, ny gun control, ny crime, virtual pat downsVideo image of the technology in use

Last week, Governor Andrew Cuomo and other New York legislators signed a bill into effect that will place stricter gun-control measures across the state — including a major expansion of the state’s assault weapons ban. Now comes news that the NYPD will soon be implementing a “virtual pat down” technology that allows law enforcement officers to detect concealed weapons being carried by individuals at a distance.


nypd, gun control, nypd gun control, gun tech, scan and frisk technology, police technology, ny gun control, ny crime, virtual pat downs

The new machine employs a technology able to read terahertz — the natural energy that is emitted by people and objects. With this terahertz reading police officers will be able to detect if an individual is carrying a weapon without even needing to touch them. “If something is obstructing the flow of that radiation, for example a weapon, the device will highlight that object,” Police Commissioner Raymond Kelly explained during a police foundation breakfast, as reported by the NY Daily News.

The NYPD has plans to soon begin testing the device for use on the street — the technology is portable and small enough to be placed on police vehicles. For over a year, the department worked closely with the London Metropolitan Police and a contractor  to create a device suited to their needs.

“We still have a number of trials to run before we can determine how best to deploy this technology,” said Kelly. “We’re also talking to our legal staff about this. But we’re very pleased with the progress we’ve made over the past year.”

Via NY Daily News

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